@ARTICLE{
author={Dankovic Danijel M,Zivanovic Emilija N,Veselinovic Nevena,Djordjevic Dunja,Petrovic Marija,Tasic Lana,Marjanovic Milos B,Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Ristic Goran S},
year={2025},
title={Examination of Impact of NBTIs on Commercial Power P-Channel VDMOS Transistors in Practical Applications},
journal={MICROMACHINES},
volume={17},
number={1},
pages={-},
document_type={Review},
} 

@ARTICLE{
author={Marjanovic Milos B,Ilic Stefan D,Veljkovic Sandra,Mitrovic Nikola I,Gurer Umutcan,Yilmaz Ozan,Kahraman Aysegul,Aktag Aliekber,Karacali Huseyin,Budak Erhan,Dankovic Danijel M,Ristic Goran S,Yilmaz Ercan},
year={2025},
title={The SPICE Modeling of a Radiation Sensor Based on a MOSFET with a Dielectric HfO<sub>2</sub>/SiO<sub>2</sub> Double-Layer},
journal={SENSORS},
volume={25},
number={2},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Djoric-Veljkovic Snezana M,Zivanovic Emilija N,Davidovic Vojkan S,Veljkovic Sandra,Mitrovic Nikola I,Ristic Goran S,Paskaleva Albena,Spassov Dencho,Dankovic Danijel M},
year={2025},
title={Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors},
journal={MICROMACHINES},
volume={16},
number={1},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M},
year={2024},
title={Successive Irradiation and Bias Temperature Stress Induced Effects on Commercial P-Channel Power Vdmos Transistors},
journal={FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS},
volume={37},
number={4},
pages={561-579},
document_type={Article},
} 

@ARTICLE{
author={Mitrovic Nikola I,Guirado Damian,Dankovic Danijel M,Palma Alberto J,Ristic Goran S,Carvajal Miguel A},
year={2024},
title={Thermal Annealing-Induced Recovery of the VT of Irradiated Commercial MOS Transistors},
journal={JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS},
volume={},
number={},
pages={-},
document_type={Article; Early Access},
} 

@ARTICLE{
author={Zivanovic Emilija N,Veljkovic Sandra,Mitrovic Nikola I,Jovanovic Igor D,Djoric-Veljkovic Snezana M,Paskaleva Albena,Spassov Dencho,Dankovic Danijel M},
year={2024},
title={A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress},
journal={MICROMACHINES},
volume={15},
number={4},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Veljkovic Sandra,Mitrovic Nikola I,Jovanovic Igor D,Zivanovic Emilija N,Paskaleva Albena,Spassov Dencho,Mancic Dragan D,Dankovic Danijel M},
year={2023},
title={Self-heating of stressed VDMOS devices under specific operating conditions},
journal={MICROELECTRONICS RELIABILITY},
volume={150},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Mitrovic Nikola I,Djordjevic Milan,Veljkovic Sandra,Dankovic Danijel M},
year={2023},
title={Implementation and Testing of Websocket Protocol in Esp32 Based Iot Systems},
journal={FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS},
volume={36},
number={2},
pages={267-284},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Marjanovic Milos B,Mitrovic Nikola I,Zivanovic Emilija N,Dankovic Milan,Prijic Aneta P,Prijic Zoran D},
year={2023},
title={The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering},
journal={IEEE TRANSACTIONS ON EDUCATION},
volume={66},
number={2},
pages={146-155},
document_type={Article},
} 

@ARTICLE{
author={Mitrovic Nikola I,Veljkovic Sandra,Davidovic Vojkan S,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Zivanovic Emilija N,Prijic Zoran D,Dankovic Danijel M},
year={2022},
title={Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications},
journal={MICROELECTRONICS RELIABILITY},
volume={138},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Golubovic Snezana M,Djoric-Veljkovic Snezana M,Paskaleva Albena,Spassov Dencho,Stankovic Srboljub J,Andjelkovic Marko Lj,Prijic Zoran D,Manic Ivica Dj,Prijic Aneta P,Ristic Goran S,Dankovic Danijel M},
year={2022},
title={Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress},
journal={JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS},
volume={31},
number={18},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Davidovic Vojkan S,Golubovic Snezana M,Veljkovic Sandra,Mitrovic Nikola I,Djoric-Veljkovic Snezana M},
year={2021},
title={Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs},
journal={MICROELECTRONICS RELIABILITY},
volume={126},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Mitrovic Nikola I,Dankovic Danijel M,Randjelovic Branislav M,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2020},
title={Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method},
journal={INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS},
volume={50},
number={3},
pages={205-214},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Mitrovic Nikola I,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2020},
title={Modeling of NBTS Effects in P-Channel Power VDMOSFETs},
journal={IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY},
volume={20},
number={1},
pages={204-213},
document_type={Article},
}