@ARTICLE{
author={Andjelkovic Marko,...,Peric Zoran H,Nikolic Jelena RA,Dincic Milan R,Jovanovic Aleksandra Z,Ciric Dejan G,Vucic Nikola J,Peric Sofija Z,Jovanovic Jelena Ra,Stojanovic Milica S,Nikolic Tatjana R,Nikolic Goran S,Nedeljkovic Jelena N,Dankovic Danijel M,Zivanovic Emilija N,Marjanovic Milos B,Veljkovic Sandra,Mitrovic Nikola I,Predic Bratislav B,Milovanovic Tamara},
year={2025},
title={AIDA4Edge: Twinning for Excellence in Adaptive Edge Artificial Intelligence},
journal={2025 28TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN, DSD},
volume={},
number={},
pages={145-152},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Dankovic Danijel M,Zivanovic Emilija N,Veselinovic Nevena,Djordjevic Dunja,Petrovic Marija,Tasic Lana,Marjanovic Milos B,Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Ristic Goran S},
year={2025},
title={Examination of Impact of NBTIs on Commercial Power P-Channel VDMOS Transistors in Practical Applications},
journal={MICROMACHINES},
volume={17},
number={1},
pages={-},
document_type={Review},
} 

@ARTICLE{
author={Tasic Lana,Veselinovic Nevena,Petrovic Marija,Djordjevic Dunja,Marjanovic Milos B,Davidovic Vojkan S,Veljkovic Sandra,Mitrovic Nikola I,Zivanovic Emilija N,Dankovic Danijel M},
year={2025},
title={Experimental and SPICE-Based Modeling of NBTI and SHE in Power P-Channel VDMOS Transistors},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={267-272},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Veselinovic Nevena,Petrovic Marija,Djordjevic Dunja,Tasic Lana,Mitrovic Nikola I,Veljkovic Sandra,Marjanovic Milos B,Zivanovic Emilija N,Davidovic Vojkan S,Dankovic Danijel M},
year={2025},
title={Impact of NBTS and Thermal Relaxation on Characteristic of CMOS Inverter},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={83-87},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Djordjevic Dunja,Tasic Lana,Veselinovic Nevena,Petrovic Marija,Veljkovic Sandra,Mitrovic Nikola I,Marjanovic Milos B,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M},
year={2025},
title={Investigation of the Self-Heating Effect in a P-Channel VDMOS Transistor after NBT Stress and Relaxation},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={79-82},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Petrovic Marija,Veselinovic Nevena,Tasic Lana,Djordjevic Dunja,Veljkovic Sandra,Mitrovic Nikola I,Marjanovic Milos B,Zivanovic Emilija N,Dankovic Danijel M},
year={2025},
title={Investigation of NBTI and Relaxation Effects in P-Channel Power VDMOS Transistors},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={73-77},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Marjanovic Milos B,Ilic Stefan D,Veljkovic Sandra,Mitrovic Nikola I,Gurer Umutcan,Yilmaz Ozan,Kahraman Aysegul,Aktag Aliekber,Karacali Huseyin,Budak Erhan,Dankovic Danijel M,Ristic Goran S,Yilmaz Ercan},
year={2025},
title={The SPICE Modeling of a Radiation Sensor Based on a MOSFET with a Dielectric HfO<sub>2</sub>/SiO<sub>2</sub> Double-Layer},
journal={SENSORS},
volume={25},
number={2},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Djoric-Veljkovic Snezana M,Zivanovic Emilija N,Davidovic Vojkan S,Veljkovic Sandra,Mitrovic Nikola I,Ristic Goran S,Paskaleva Albena,Spassov Dencho,Dankovic Danijel M},
year={2025},
title={Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors},
journal={MICROMACHINES},
volume={16},
number={1},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M},
year={2024},
title={Successive Irradiation and Bias Temperature Stress Induced Effects on Commercial P-Channel Power Vdmos Transistors},
journal={FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS},
volume={37},
number={4},
pages={561-579},
document_type={Article},
} 

@ARTICLE{
author={Mitrovic Nikola I,Guirado Damian,Dankovic Danijel M,Palma Alberto J,Ristic Goran S,Carvajal Miguel A},
year={2024},
title={Thermal Annealing-Induced Recovery of the VT of Irradiated Commercial MOS Transistors},
journal={JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS},
volume={},
number={},
pages={-},
document_type={Article; Early Access},
} 

@ARTICLE{
author={Mitrovic Nikola I,Veljkovic Sandra,Prijic Zoran D,Dankovic Danijel M},
year={2024},
title={Design and testing of low-cost portable magnetometer for consumer applications},
journal={2024 ZOOMING INNOVATION IN CONSUMER TECHNOLOGIES CONFERENCE, ZINC 2024},
volume={},
number={},
pages={96-99},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Zivanovic Emilija N,Veljkovic Sandra,Mitrovic Nikola I,Jovanovic Igor D,Djoric-Veljkovic Snezana M,Paskaleva Albena,Spassov Dencho,Dankovic Danijel M},
year={2024},
title={A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress},
journal={MICROMACHINES},
volume={15},
number={4},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Andjelkovic Marko Lj,...,Ilic Stefan D,Marjanovic Milos B,Veljkovic Sandra,Mitrovic Nikola I,Dankovic Danijel M,Ristic Goran S,...,(broj koautora 18)},
year={2023},
title={Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System},
journal={2023 26TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN, DSD 2023},
volume={},
number={},
pages={286-293},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Veljkovic Sandra,Mitrovic Nikola I,Jovanovic Igor D,Zivanovic Emilija N,Paskaleva Albena,Spassov Dencho,Mancic Dragan D,Dankovic Danijel M},
year={2023},
title={Self-heating of stressed VDMOS devices under specific operating conditions},
journal={MICROELECTRONICS RELIABILITY},
volume={150},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Mitrovic Nikola I,Djordjevic Milan,Veljkovic Sandra,Dankovic Danijel M},
year={2023},
title={Implementation and Testing of Websocket Protocol in Esp32 Based Iot Systems},
journal={FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS},
volume={36},
number={2},
pages={267-284},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Marjanovic Milos B,Mitrovic Nikola I,Zivanovic Emilija N,Dankovic Milan,Prijic Aneta P,Prijic Zoran D},
year={2023},
title={The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering},
journal={IEEE TRANSACTIONS ON EDUCATION},
volume={66},
number={2},
pages={146-155},
document_type={Article},
} 

@ARTICLE{
author={Mitrovic Nikola I,Veljkovic Sandra,Davidovic Vojkan S,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Zivanovic Emilija N,Prijic Zoran D,Dankovic Danijel M},
year={2022},
title={Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications},
journal={MICROELECTRONICS RELIABILITY},
volume={138},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Golubovic Snezana M,Djoric-Veljkovic Snezana M,Paskaleva Albena,Spassov Dencho,Stankovic Srboljub J,Andjelkovic Marko Lj,Prijic Zoran D,Manic Ivica Dj,Prijic Aneta P,Ristic Goran S,Dankovic Danijel M},
year={2022},
title={Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress},
journal={JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS},
volume={31},
number={18},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Davidovic Vojkan S,Golubovic Snezana M,Veljkovic Sandra,Mitrovic Nikola I,Djoric-Veljkovic Snezana M},
year={2021},
title={Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs},
journal={MICROELECTRONICS RELIABILITY},
volume={126},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Mitrovic Nikola I,Stojanovic Milan D},
year={2020},
title={Practical Methods for Teaching of Solar Cell Characterization},
journal={2020 55TH INTERNATIONAL SCIENTIFIC CONFERENCE ON INFORMATION, COMMUNICATION AND ENERGY SYSTEMS AND TECHNOLOGIES (IEEE ICEST 2020)},
volume={},
number={},
pages={85-88},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Mitrovic Nikola I,Dankovic Danijel M,Randjelovic Branislav M,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2020},
title={Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method},
journal={INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS},
volume={50},
number={3},
pages={205-214},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Mitrovic Nikola I,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2020},
title={Modeling of NBTS Effects in P-Channel Power VDMOSFETs},
journal={IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY},
volume={20},
number={1},
pages={204-213},
document_type={Article},
} 

@ARTICLE{
author={Mitrovic Nikola I,Dankovic Danijel M,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2019},
title={Modelling of Delta V-T in NBT Stressed P-Channel Power VDMOSFETs},
journal={2019 IEEE 31ST INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL 2019)},
volume={},
number={},
pages={177-180},
document_type={Proceedings Paper},
}