@ARTICLE{
author={Jelenkovic Emil V,Kovcevic Milojko,Jha Shrawan K,Tong KY,Nikezic Dragoslav R},
year={2013},
title={Defect generation in non-nitrided and nitrided sputtered gate oxides under post-irradiation Fowler-Nordheim constant current stress},
journal={MICROELECTRONIC ENGINEERING},
volume={104},
number={},
pages={90-94},
document_type={Article},
}