@ARTICLE{
author={Davidovic Vojkan S,Kouvatsos DN,Stojadinovic Ninoslav D,Voutsas AT},
year={2007},
title={Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors},
journal={MICROELECTRONICS RELIABILITY},
volume={47},
number={9-11},
pages={1841-1845},
document_type={Article},
} 

@ARTICLE{
author={Kouvatsos DN,Davidovic Vojkan S,Papaioannou GJ,Stojadinovic Ninoslav D,Michalas L,Exarchos M,Voutsas AT,Goustouridis D},
year={2004},
title={Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors},
journal={MICROELECTRONICS RELIABILITY},
volume={44},
number={9-11},
pages={1631-1636},
document_type={Article},
}