@ARTICLE{
author={Jelenkovic Emil V,Ristic Goran S,Pejovic Milic M,Jevtic Milan M,Jha Shrawan K,Videnovic-Misic Mirjana S,Pejovic Momcilo M,Tong KY},
year={2011},
title={Effect of fluorination and hydrogenation by ion implantation on reliability of poly-Si TFTs under gamma irradiation},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={44},
number={1},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M},
year={2009},
title={Low frequency noise as a tool for diagnostic of ESD degraded GaAs mesfets},
journal={JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS},
volume={11},
number={2},
pages={155-163},
document_type={Article},
} 

@ARTICLE{
author={Videnovic-Misic Mirjana S,Jevtic Milan M},
year={2008},
title={Impact of bias condition on 1/f noise of dual-gate depletion type MOSFET in linear region and consequences for noise diagnostic application and modelling},
journal={MICROELECTRONICS RELIABILITY},
volume={48},
number={7},
pages={1008-1014},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Smiljanic Miloljub A},
year={2008},
title={Diagnostic of silicon piezoresistive pressure sensors by low frequency noise measurements},
journal={SENSORS AND ACTUATORS A-PHYSICAL},
volume={144},
number={2},
pages={267-274},
document_type={Article},
} 

@ARTICLE{
author={Stanimirovic Zdravko I,Jevtic Milan M,Stanimirovic Ivanka P},
year={2008},
title={Simultaneous mechanical and electrical straining of conventional thick-film resistors},
journal={MICROELECTRONICS RELIABILITY},
volume={48},
number={1},
pages={59-67},
document_type={Article},
} 

@ARTICLE{
author={Jelenkovic Emil V,Jevtic Milan M,Tong KY,Pang GKH,Cheung WY,Jha Shrawan K},
year={2007},
title={On temperature coefficient of resistance of boron-doped SiGe films deposited by sputtering},
journal={MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING},
volume={10},
number={4-5},
pages={143-149},
document_type={Article},
} 

@ARTICLE{
author={Stanimirovic Ivanka P,Jevtic Milan M,Stanimirovic Zdravko I},
year={2007},
title={Multiple high-voltage pulse stressing of conventional thick-film resistors},
journal={MICROELECTRONICS RELIABILITY},
volume={47},
number={12},
pages={2242-2248},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M},
year={2007},
title={Diagnostics of GaAsHEMT based on noise measurements},
journal={JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS},
volume={9},
number={11},
pages={3579-3584},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M},
year={2007},
title={Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements},
journal={MICROELECTRONICS RELIABILITY},
volume={47},
number={1},
pages={51-58},
document_type={Article},
} 

@ARTICLE{
author={Hadzi-Vukovic Jovan M,Jevtic Milan M},
year={2007},
title={The voltage pulse degraded Ti/4H-SiC Schottky diodes studied with I-V and low frequency noise measurements},
journal={DIAMOND AND RELATED MATERIALS},
volume={16},
number={1},
pages={81-89},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Jelenkovic Emil V,Tong KY,Pang GKH},
year={2006},
title={Noise and structural properties of reactively sputtered RuO2 thin films},
journal={THIN SOLID FILMS},
volume={496},
number={2},
pages={214-220},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M},
year={2004},
title={Low frequency noise as a tool to study optocouplers with phototransistors},
journal={MICROELECTRONICS RELIABILITY},
volume={44},
number={7},
pages={1123-1130},
document_type={Article},
} 

@ARTICLE{
author={Stanimirovic Ivanka P,Jevtic Milan M,Stanimirovic Zdravko I},
year={2003},
title={High-voltage pulse stressing of thick-film resistors and noise},
journal={MICROELECTRONICS RELIABILITY},
volume={43},
number={6},
pages={905-911},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M,Ramovic Rifat M},
year={2002},
title={An alternative method for transistor low frequency noise estimation by measuring phase noise of test oscillator},
journal={MICROELECTRONICS JOURNAL},
volume={33},
number={11},
pages={955-960},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Scepanovic Maja J},
year={2002},
title={Effects of Hg evaporation in numerical simulation of laser induced changes in Hg1-xCdxTe},
journal={PHYSICA STATUS SOLIDI A-APPLIED RESEARCH},
volume={191},
number={1},
pages={77-88},
document_type={Article},
} 

@ARTICLE{
author={Scepanovic Maja J,Jevtic Milan M},
year={2001},
title={Raman measurements of laser-induced structural and compositional disorder in Hg1-chi Cd chi Te},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={34},
number={23},
pages={3418-3423},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Stanimirovic Zdravko I,Stanimirovic Ivanka P},
year={2001},
title={Evaluation of thick-film resistor structural parameters based on noise index measurements},
journal={MICROELECTRONICS RELIABILITY},
volume={41},
number={1},
pages={59-66},
document_type={Article},
}