Jevtic Milan M,Hadzi-Vukovic Jovan M (2009) Low frequency noise as a tool for diagnostic of ESD degraded GaAs mesfets, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, vol. 11, br. 2, str. 155-163 (Article) 

Hadzi-Vukovic Jovan M,Jevtic Milan M,Glavanovics M,Rothleitner H (2008) The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, vol. 205, br. 11, str. 2544-2547 (Proceedings Paper) 

Jevtic Milan M,Hadzi-Vukovic Jovan M (2007) Diagnostics of GaAsHEMT based on noise measurements, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, vol. 9, br. 11, str. 3579-3584 (Article) 

Jevtic Milan M,Hadzi-Vukovic Jovan M (2007) Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements, MICROELECTRONICS RELIABILITY, vol. 47, br. 1, str. 51-58 (Article) 

Hadzi-Vukovic Jovan M,Jevtic Milan M (2007) The voltage pulse degraded Ti/4H-SiC Schottky diodes studied with I-V and low frequency noise measurements, DIAMOND AND RELATED MATERIALS, vol. 16, br. 1, str. 81-89 (Article) 

Jevtic Milan M,Hadzi-Vukovic Jovan M (2006) Low frequency noise of GaAs MESFET degraded in ESD test, 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, vol. , br. , str. 569-572 (Proceedings Paper) 

Hadzi-Vukovic Jovan M,Jevtic Milan M (2005) The study of PMOS V-th distribution using process and device Simulations and C-V measurements, Eurocon 2005: The International Conference on Computer as a Tool, Vol 1 and 2 , Proceedings, vol. , br. , str. 871-874 (Proceedings Paper) 

Jevtic Milan M,Hadzi-Vukovic Jovan M,Dinu Dan (2005) Pulse voltage stress degradation of 4H-SiC Schottky diodes studied by I-V and noise measurements, CAS 2005:  INTERNATIONAL SEMICONDUCTOR CONFERENCE VOL 1 AND 2, vol. , br. , str. 369-372 (Proceedings Paper) 

Jevtic Milan M,Hadzi-Vukovic Jovan M,Ramovic Rifat M (2002) An alternative method for transistor low frequency noise estimation by measuring phase noise of test oscillator, MICROELECTRONICS JOURNAL, vol. 33, br. 11, str. 955-960 (Article) 

Ramovic Rifat M,Jevtic Milan M,Hadzi-Vukovic Jovan M,Randjelovic Danijela V (2002) A novel analytical model of a SiC MOSFET, 2002 23RD INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS, vol. , br. , str. 447-450 (Proceedings Paper) 

Simic D,Hadzi-Vukovic Jovan M,Jevtic Milan M (2001) A method for VCO phase noise analysis, TELSIKS 2001, VOL 1 & 2, PROCEEDINGS, vol. , br. , str. 309-312 (Proceedings Paper)