@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M},
year={2009},
title={Low frequency noise as a tool for diagnostic of ESD degraded GaAs mesfets},
journal={JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS},
volume={11},
number={2},
pages={155-163},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M},
year={2007},
title={Diagnostics of GaAsHEMT based on noise measurements},
journal={JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS},
volume={9},
number={11},
pages={3579-3584},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M},
year={2007},
title={Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements},
journal={MICROELECTRONICS RELIABILITY},
volume={47},
number={1},
pages={51-58},
document_type={Article},
} 

@ARTICLE{
author={Hadzi-Vukovic Jovan M,Jevtic Milan M},
year={2007},
title={The voltage pulse degraded Ti/4H-SiC Schottky diodes studied with I-V and low frequency noise measurements},
journal={DIAMOND AND RELATED MATERIALS},
volume={16},
number={1},
pages={81-89},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M,Ramovic Rifat M},
year={2002},
title={An alternative method for transistor low frequency noise estimation by measuring phase noise of test oscillator},
journal={MICROELECTRONICS JOURNAL},
volume={33},
number={11},
pages={955-960},
document_type={Article},
}