@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M},
year={2009},
title={Low frequency noise as a tool for diagnostic of ESD degraded GaAs mesfets},
journal={JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS},
volume={11},
number={2},
pages={155-163},
document_type={Article},
} 

@ARTICLE{
author={Hadzi-Vukovic Jovan M,Jevtic Milan M,Glavanovics M,Rothleitner H},
year={2008},
title={The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements},
journal={PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE},
volume={205},
number={11},
pages={2544-2547},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M},
year={2007},
title={Diagnostics of GaAsHEMT based on noise measurements},
journal={JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS},
volume={9},
number={11},
pages={3579-3584},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M},
year={2007},
title={Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements},
journal={MICROELECTRONICS RELIABILITY},
volume={47},
number={1},
pages={51-58},
document_type={Article},
} 

@ARTICLE{
author={Hadzi-Vukovic Jovan M,Jevtic Milan M},
year={2007},
title={The voltage pulse degraded Ti/4H-SiC Schottky diodes studied with I-V and low frequency noise measurements},
journal={DIAMOND AND RELATED MATERIALS},
volume={16},
number={1},
pages={81-89},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M},
year={2006},
title={Low frequency noise of GaAs MESFET degraded in ESD test},
journal={2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings},
volume={},
number={},
pages={569-572},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Hadzi-Vukovic Jovan M,Jevtic Milan M},
year={2005},
title={The study of PMOS V-th distribution using process and device Simulations and C-V measurements},
journal={Eurocon 2005: The International Conference on Computer as a Tool, Vol 1 and 2 , Proceedings},
volume={},
number={},
pages={871-874},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M,Dinu Dan},
year={2005},
title={Pulse voltage stress degradation of 4H-SiC Schottky diodes studied by I-V and noise measurements},
journal={CAS 2005:  INTERNATIONAL SEMICONDUCTOR CONFERENCE VOL 1 AND 2},
volume={},
number={},
pages={369-372},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Jevtic Milan M,Hadzi-Vukovic Jovan M,Ramovic Rifat M},
year={2002},
title={An alternative method for transistor low frequency noise estimation by measuring phase noise of test oscillator},
journal={MICROELECTRONICS JOURNAL},
volume={33},
number={11},
pages={955-960},
document_type={Article},
} 

@ARTICLE{
author={Ramovic Rifat M,Jevtic Milan M,Hadzi-Vukovic Jovan M,Randjelovic Danijela V},
year={2002},
title={A novel analytical model of a SiC MOSFET},
journal={2002 23RD INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS},
volume={},
number={},
pages={447-450},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Simic D,Hadzi-Vukovic Jovan M,Jevtic Milan M},
year={2001},
title={A method for VCO phase noise analysis},
journal={TELSIKS 2001, VOL 1 & 2, PROCEEDINGS},
volume={},
number={},
pages={309-312},
document_type={Proceedings Paper},
}