@ARTICLE{
author={Veljkovic Sandra,Mitrovic N,Davidovic Vojkan S,Paskaleva Albena,Spassov Dencho,Marjanovic M,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M},
year={2026},
title={Influence of controlling signal parameters and prior stresses on the self-heating of VDMOS power transistors},
journal={MICROELECTRONICS RELIABILITY},
volume={181},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Andjelkovic Marko,...,Peric Zoran H,Nikolic Jelena RA,Dincic Milan R,Jovanovic Aleksandra Z,Ciric Dejan G,Vucic Nikola J,Peric Sofija Z,Jovanovic Jelena Ra,Stojanovic Milica S,Nikolic Tatjana R,Nikolic Goran S,Nedeljkovic Jelena N,Dankovic Danijel M,Zivanovic Emilija N,Marjanovic Milos B,Veljkovic Sandra,Mitrovic Nikola I,Predic Bratislav B,Milovanovic Tamara},
year={2025},
title={AIDA4Edge: Twinning for Excellence in Adaptive Edge Artificial Intelligence},
journal={2025 28TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN, DSD},
volume={},
number={},
pages={145-152},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Dankovic Danijel M,Zivanovic Emilija N,Veselinovic Nevena,Djordjevic Dunja,Petrovic Marija,Tasic Lana,Marjanovic Milos B,Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Ristic Goran S},
year={2025},
title={Examination of Impact of NBTIs on Commercial Power P-Channel VDMOS Transistors in Practical Applications},
journal={MICROMACHINES},
volume={17},
number={1},
pages={-},
document_type={Review},
} 

@ARTICLE{
author={Marjanovic Milos B,Andjelkovic Marko,Dankovic Danijel M,Nikolic Jelena RA,Vargas Fabian},
year={2025},
title={Performance Evaluation of Digital Multipliers for Application in Neural Network Accelerators},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={389-394},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Peric Zoran H,Dincic Milan R,Nikolic Jelena RA,Dankovic Danijel M,Andjelkovic Marko,Bertozzi Davide,Zese Riccardo},
year={2025},
title={AIDA4Edge Project's Special Session on Hardware and Software Solutions for Edge AI Applications},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={361-362},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Aleksandrova Mariya,Tomov Rade,Dankovic Danijel M,Davidovic Vojkan S,Stankovic Srboljub J},
year={2025},
title={Investigating the Effects of Irradiation on the Performance of Carbyne-based Surface Acoustic Wave Sensors},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={295-298},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Tasic Lana,Veselinovic Nevena,Petrovic Marija,Djordjevic Dunja,Marjanovic Milos B,Davidovic Vojkan S,Veljkovic Sandra,Mitrovic Nikola I,Zivanovic Emilija N,Dankovic Danijel M},
year={2025},
title={Experimental and SPICE-Based Modeling of NBTI and SHE in Power P-Channel VDMOS Transistors},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={267-272},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Veselinovic Nevena,Petrovic Marija,Djordjevic Dunja,Tasic Lana,Mitrovic Nikola I,Veljkovic Sandra,Marjanovic Milos B,Zivanovic Emilija N,Davidovic Vojkan S,Dankovic Danijel M},
year={2025},
title={Impact of NBTS and Thermal Relaxation on Characteristic of CMOS Inverter},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={83-87},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Djordjevic Dunja,Tasic Lana,Veselinovic Nevena,Petrovic Marija,Veljkovic Sandra,Mitrovic Nikola I,Marjanovic Milos B,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M},
year={2025},
title={Investigation of the Self-Heating Effect in a P-Channel VDMOS Transistor after NBT Stress and Relaxation},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={79-82},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Petrovic Marija,Veselinovic Nevena,Tasic Lana,Djordjevic Dunja,Veljkovic Sandra,Mitrovic Nikola I,Marjanovic Milos B,Zivanovic Emilija N,Dankovic Danijel M},
year={2025},
title={Investigation of NBTI and Relaxation Effects in P-Channel Power VDMOS Transistors},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={73-77},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Andjelkovic Marko,Chen Junchao,Aleksic Jelisaveta,Padmakumar Vishnu,Marjanovic Milos B,Zazatis Nikolaos,Lenka Trupti Ranjan,Dankovic Danijel M,Sotiriou Christos,Vargas Fabian},
year={2025},
title={Prediction of Single Event Transient Propagation Using Machine Learning Models},
journal={2025 21ST INTERNATIONAL CONFERENCE ON SYNTHESIS, MODELING, ANALYSIS AND SIMULATION METHODS, AND APPLICATIONS TO CIRCUITS DESIGN, SMACD},
volume={},
number={},
pages={-},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Marjanovic Milos B,Ilic Stefan D,Veljkovic Sandra,Mitrovic Nikola I,Gurer Umutcan,Yilmaz Ozan,Kahraman Aysegul,Aktag Aliekber,Karacali Huseyin,Budak Erhan,Dankovic Danijel M,Ristic Goran S,Yilmaz Ercan},
year={2025},
title={The SPICE Modeling of a Radiation Sensor Based on a MOSFET with a Dielectric HfO<sub>2</sub>/SiO<sub>2</sub> Double-Layer},
journal={SENSORS},
volume={25},
number={2},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Djoric-Veljkovic Snezana M,Zivanovic Emilija N,Davidovic Vojkan S,Veljkovic Sandra,Mitrovic Nikola I,Ristic Goran S,Paskaleva Albena,Spassov Dencho,Dankovic Danijel M},
year={2025},
title={Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors},
journal={MICROMACHINES},
volume={16},
number={1},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M},
year={2024},
title={Successive Irradiation and Bias Temperature Stress Induced Effects on Commercial P-Channel Power Vdmos Transistors},
journal={FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS},
volume={37},
number={4},
pages={561-579},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M},
year={2024},
title={Editorial Thematic Issue on Failure Mechanisms in Microelectronic Devices},
journal={FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS},
volume={37},
number={4},
pages={-},
document_type={Editorial Material},
} 

@ARTICLE{
author={Mitrovic Nikola I,Guirado Damian,Dankovic Danijel M,Palma Alberto J,Ristic Goran S,Carvajal Miguel A},
year={2024},
title={Thermal Annealing-Induced Recovery of the VT of Irradiated Commercial MOS Transistors},
journal={JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS},
volume={},
number={},
pages={-},
document_type={Article; Early Access},
} 

@ARTICLE{
author={Djordjevic Milos D,Paunovic Vesna V,Dankovic Danijel M},
year={2024},
title={A Method for Automatic Characterization and Measurement of Ceramic Materials Using Virtual Instrumentation},
journal={JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS},
volume={},
number={},
pages={-},
document_type={Article; Early Access},
} 

@ARTICLE{
author={Mitrovic Nikola I,Veljkovic Sandra,Prijic Zoran D,Dankovic Danijel M},
year={2024},
title={Design and testing of low-cost portable magnetometer for consumer applications},
journal={2024 ZOOMING INNOVATION IN CONSUMER TECHNOLOGIES CONFERENCE, ZINC 2024},
volume={},
number={},
pages={96-99},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Zivanovic Emilija N,Veljkovic Sandra,Mitrovic Nikola I,Jovanovic Igor D,Djoric-Veljkovic Snezana M,Paskaleva Albena,Spassov Dencho,Dankovic Danijel M},
year={2024},
title={A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress},
journal={MICROMACHINES},
volume={15},
number={4},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Andjelkovic Marko Lj,...,Ilic Stefan D,Marjanovic Milos B,Veljkovic Sandra,Mitrovic Nikola I,Dankovic Danijel M,Ristic Goran S,...,(broj koautora 18)},
year={2023},
title={Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System},
journal={2023 26TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN, DSD 2023},
volume={},
number={},
pages={286-293},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Veljkovic Sandra,Mitrovic Nikola I,Jovanovic Igor D,Zivanovic Emilija N,Paskaleva Albena,Spassov Dencho,Mancic Dragan D,Dankovic Danijel M},
year={2023},
title={Self-heating of stressed VDMOS devices under specific operating conditions},
journal={MICROELECTRONICS RELIABILITY},
volume={150},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Mitrovic Nikola I,Djordjevic Milan,Veljkovic Sandra,Dankovic Danijel M},
year={2023},
title={Implementation and Testing of Websocket Protocol in Esp32 Based Iot Systems},
journal={FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS},
volume={36},
number={2},
pages={267-284},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Marjanovic Milos B,Mitrovic Nikola I,Zivanovic Emilija N,Dankovic Milan,Prijic Aneta P,Prijic Zoran D},
year={2023},
title={The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering},
journal={IEEE TRANSACTIONS ON EDUCATION},
volume={66},
number={2},
pages={146-155},
document_type={Article},
} 

@ARTICLE{
author={Marjanovic Milos B,Stojkovic Aleksandra,Prijic Aneta P,Dankovic Danijel M,Prijic Zoran D},
year={2022},
title={Spatial Spice Model of a Wireless Al Spice Model of a Wire Sensor Network Node Based on R Network Node Based},
journal={FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS},
volume={35},
number={4},
pages={513-539},
document_type={Article},
} 

@ARTICLE{
author={Mitrovic Nikola I,Veljkovic Sandra,Davidovic Vojkan S,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Zivanovic Emilija N,Prijic Zoran D,Dankovic Danijel M},
year={2022},
title={Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications},
journal={MICROELECTRONICS RELIABILITY},
volume={138},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Golubovic Snezana M,Djoric-Veljkovic Snezana M,Paskaleva Albena,Spassov Dencho,Stankovic Srboljub J,Andjelkovic Marko Lj,Prijic Zoran D,Manic Ivica Dj,Prijic Aneta P,Ristic Goran S,Dankovic Danijel M},
year={2022},
title={Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress},
journal={JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS},
volume={31},
number={18},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Davidovic Vojkan S,Golubovic Snezana M,Veljkovic Sandra,Mitrovic Nikola I,Djoric-Veljkovic Snezana M},
year={2021},
title={Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs},
journal={MICROELECTRONICS RELIABILITY},
volume={126},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Mitrovic Nikola I,Dankovic Danijel M,Randjelovic Branislav M,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2020},
title={Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method},
journal={INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS},
volume={50},
number={3},
pages={205-214},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Djordjevic Milos D},
year={2020},
title={A Review of Real Time Smart Systems Developed at University of Nis},
journal={FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS},
volume={33},
number={4},
pages={669-686},
document_type={Review},
} 

@ARTICLE{
author={Djordjevic Milos D,Jovicic Branislav,Markovic Stefan,Paunovic Vesna V,Dankovic Danijel M},
year={2020},
title={A smart data logger system based on sensor and Internet of Things technology as part of the smart faculty},
journal={JOURNAL OF AMBIENT INTELLIGENCE AND SMART ENVIRONMENTS},
volume={12},
number={4},
pages={359-373},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Mitrovic Nikola I,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2020},
title={Modeling of NBTS Effects in P-Channel Power VDMOSFETs},
journal={IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY},
volume={20},
number={1},
pages={204-213},
document_type={Article},
} 

@ARTICLE{
author={Djordjevic Milos D,Paunovic Vesna V,Dankovic Danijel M,Pejovic Milic M},
year={2019},
title={A Method for Automating the Measurement and Characterization of Electrical Materials},
journal={2019 14TH INTERNATIONAL CONFERENCE ON ADVANCED TECHNOLOGIES, SYSTEMS AND SERVICES IN TELECOMMUNICATIONS (TELSIKS 2019)},
volume={},
number={},
pages={219-222},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Mitrovic Nikola I,Dankovic Danijel M,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2019},
title={Modelling of Delta V-T in NBT Stressed P-Channel Power VDMOSFETs},
journal={2019 IEEE 31ST INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL 2019)},
volume={},
number={},
pages={177-180},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Stojadinovic Ninoslav D,Djoric-Veljkovic Snezana M,Davidovic Vojkan S,Golubovic Snezana M,Stankovic Srboljub J,Prijic Aneta P,Prijic Zoran D,Manic Ivica Dj,Dankovic Danijel M},
year={2018},
title={NBTI and irradiation related degradation mechanisms in power VDMOS transistors},
journal={MICROELECTRONICS RELIABILITY},
volume={88-90},
number={},
pages={135-141},
document_type={Article; Proceedings Paper},
} 

@ARTICLE{
author={Dankovic Danijel M,Manic Ivica Dj,Prijic Aneta P,Davidovic Vojkan S,Prijic Zoran D,Golubovic Snezana M,Djoric-Veljkovic Snezana M,Paskaleva Albena,Spassov Dencho,Stojadinovic Ninoslav D},
year={2018},
title={A review of pulsed NBTI in P-channel power VDMOSFETs},
journal={MICROELECTRONICS RELIABILITY},
volume={82},
number={},
pages={28-36},
document_type={Review},
} 

@ARTICLE{
author={Davidovic Vojkan S,Dankovic Danijel M,Ilic Aleksandar,Manic Ivica Dj,Golubovic Snezana M,Djoric-Veljkovic Snezana M,Prijic Zoran D,Prijic Aneta P,Stojadinovic Ninoslav D},
year={2018},
title={Effects of consecutive irradiation and bias temperature stress in p-channel power vertical double-diffused metal oxide semiconductor transistors},
journal={JAPANESE JOURNAL OF APPLIED PHYSICS},
volume={57},
number={4},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Manic Ivica Dj,Stojadinovic Ninoslav D,Prijic Zoran D,Djoric-Veljkovic Snezana M,Davidovic Vojkan S,Prijic Aneta P,Paskaleva Albena,Spassov Dencho,Golubovic Snezana M},
year={2017},
title={Modelling of Threshold Voltage Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs},
journal={2017 IEEE 30TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL)},
volume={},
number={},
pages={147-151},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Davidovic Vojkan S,Paskaleva Albena,Spassov Dencho,Guziewicz Elzbieta,Krajewski T,Golubovic Snezana M,Djoric-Veljkovic Snezana M,Manic Ivica Dj,Dankovic Danijel M,Stojadinovic Ninoslav D},
year={2017},
title={Electrical and Charge Trapping Properties of HfO2/Al2O3 Multilayer Dielectric Stacks},
journal={2017 IEEE 30TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL)},
volume={},
number={},
pages={143-146},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Dankovic Danijel M,Manic Ivica Dj,Davidovic Vojkan S,Prijic Aneta P,Marjanovic Milos B,Ilic Aleksandar,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2016},
title={On the Recoverable and Permanent Components of NBTI in p-Channel Power VDMOSFETs},
journal={IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY},
volume={16},
number={4},
pages={522-531},
document_type={Article},
} 

@ARTICLE{
author={Davidovic Vojkan S,Dankovic Danijel M,Ilic Aleksandar,Manic Ivica Dj,Golubovic Snezana M,Djoric-Veljkovic Snezana M,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2016},
title={NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors},
journal={IEEE TRANSACTIONS ON NUCLEAR SCIENCE},
volume={63},
number={2},
pages={1268-1275},
document_type={Article},
} 

@ARTICLE{
author={Marjanovic Milos B,Dankovic Danijel M,Davidovic Vojkan S,Prijic Aneta P,Stojadinovic Ninoslav D,Prijic Zoran D,Jankovic Nebojsa D},
year={2015},
title={Modeling and PSPICE Simulation of Radiation Stress Influence on Threshold Voltage Shifts in P-Channel Power VDMOS Transistors},
journal={RAD 2015: THE THIRD INTERNATIONAL CONFERENCE ON RADIATION AND APPLICATIONS IN VARIOUS FIELDS OF RESEARCH},
volume={},
number={},
pages={405-408},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Marjanovic Milos B,Dankovic Danijel M,Prijic Aneta P,Paunovic Vesna V,Prijic Zoran D},
year={2015},
title={High Frequency Characterization and Modelling of Ceramic Capacitors},
journal={2015 12TH INTERNATIONAL CONFERENCE ON TELECOMMUNICATIONS IN MODERN SATELLITE, CABLE AND BROADCASTING SERVICES (TELSIKS)},
volume={},
number={},
pages={110-113},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Dankovic Danijel M,Stojadinovic Ninoslav D,Prijic Zoran D,Manic Ivica Dj,Davidovic Vojkan S,Prijic Aneta P,Djoric-Veljkovic Snezana M,Golubovic Snezana M},
year={2015},
title={Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET},
journal={CHINESE PHYSICS B},
volume={24},
number={10},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Manic Ivica Dj,Prijic Aneta P,Djoric-Veljkovic Snezana M,Davidovic Vojkan S,Stojadinovic Ninoslav D,Prijic Zoran D,Golubovic Snezana M},
year={2015},
title={Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation},
journal={SEMICONDUCTOR SCIENCE AND TECHNOLOGY},
volume={30},
number={10},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Djoric-Veljkovic Snezana M,Manic Ivica Dj,Davidovic Vojkan S,Dankovic Danijel M,Golubovic Snezana M,Stojadinovic Ninoslav D},
year={2015},
title={Annealing influence on recovery of electrically stressed power vertical double-diffused metal oxide semiconductor transistors},
journal={JAPANESE JOURNAL OF APPLIED PHYSICS},
volume={54},
number={6},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Stojadinovic Ninoslav D,Prijic Zoran D,Manic Ivica Dj,Prijic Aneta P},
year={2014},
title={Recoverable and Permanent Components of V-T Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs},
journal={2014 29TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS PROCEEDINGS - MIEL 2014},
volume={},
number={},
pages={297-300},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Djoric-Veljkovic Snezana M,Davidovic Vojkan S,Dankovic Danijel M,Manic Ivica Dj,Golubovic Snezana M,Stojadinovic Ninoslav D},
year={2014},
title={Recovery Treatment Effects on Gamma Radiation Response in Electrically Stressed Power VDMOS Transistors},
journal={2014 29TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS PROCEEDINGS - MIEL 2014},
volume={},
number={},
pages={293-296},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Manic Ivica Dj,Dankovic Danijel M,Prijic Aneta P,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2014},
title={Measurement of NBTI Degradation in p-channel Power VDMOSFETs},
journal={INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS},
volume={44},
number={4},
pages={280-287},
document_type={Article},
} 

@ARTICLE{
author={Djoric-Veljkovic Snezana M,Manic Ivica Dj,Davidovic Vojkan S,Dankovic Danijel M,Golubovic Snezana M,Stojadinovic Ninoslav D},
year={2013},
title={The Comparison of Gamma-Radiation and Electrical Stress Influences on Oxide and Interface Defects in Power Vdmosfet},
journal={NUCLEAR TECHNOLOGY & RADIATION PROTECTION},
volume={28},
number={4},
pages={406-414},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Vracar Ljubomir M,Prijic Aneta P,Prijic Zoran D},
year={2013},
title={An Electromechanical Approach to a Printed Circuit Board Design Course},
journal={IEEE TRANSACTIONS ON EDUCATION},
volume={56},
number={4},
pages={470-477},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Manic Ivica Dj,Prijic Aneta P,Davidovic Vojkan S,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2013},
title={Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs},
journal={INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS},
volume={43},
number={1},
pages={58-66},
document_type={Article},
} 

@ARTICLE{
author={Prijic Aneta P,Dankovic Danijel M,Vracar Ljubomir M,Manic Ivica Dj,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2012},
title={A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors},
journal={MEASUREMENT SCIENCE & TECHNOLOGY},
volume={23},
number={8},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Manic Ivica Dj,Dankovic Danijel M,Prijic Aneta P,Davidovic Vojkan S,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Prijic Zoran D,Stojadinovic Ninoslav D},
year={2011},
title={NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions},
journal={MICROELECTRONICS RELIABILITY},
volume={51},
number={9-11},
pages={1540-1543},
document_type={Article},
} 

@ARTICLE{
author={Djoric-Veljkovic Snezana M,Manic Ivica Dj,Davidovic Vojkan S,Dankovic Danijel M,Golubovic Snezana M,Stojadinovic Ninoslav D},
year={2011},
title={Annealing of Radiation-induced Defects in Burn-in Stressed Power Vdmosfets},
journal={NUCLEAR TECHNOLOGY & RADIATION PROTECTION},
volume={26},
number={1},
pages={18-24},
document_type={Article},
} 

@ARTICLE{
author={Stojadinovic Ninoslav D,Dankovic Danijel M,Manic Ivica Dj,Prijic Aneta P,Davidovic Vojkan S,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Prijic Zoran D},
year={2010},
title={Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress},
journal={MICROELECTRONICS RELIABILITY},
volume={50},
number={9-11},
pages={1278-1282},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Manic Ivica Dj,Dankovic Danijel M,Djoric-Veljkovic Snezana M,Davidovic Vojkan S,Golubovic Snezana M,Stojadinovic Ninoslav D},
year={2009},
title={Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs},
journal={MICROELECTRONICS RELIABILITY},
volume={49},
number={9-11},
pages={1003-1007},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Dankovic Danijel M,Manic Ivica Dj,Davidovic Vojkan S,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Stojadinovic Ninoslav D},
year={2008},
title={Negative bias temperature instability in n-channel power VDMOSFETs},
journal={MICROELECTRONICS RELIABILITY},
volume={48},
number={8-9},
pages={1313-1317},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Davidovic Vojkan S,Stojadinovic Ninoslav D,Dankovic Danijel M,Golubovic Snezana M,Manic Ivica Dj,Djoric-Veljkovic Snezana M,Dimitrijev Sima},
year={2008},
title={Turn-Around of Threshold Voltage in Gate Bias Stressed p-Channel Power Vertical Double-Diffused Metal-Oxide-Semiconductor Transistors},
journal={JAPANESE JOURNAL OF APPLIED PHYSICS},
volume={47},
number={8},
pages={6272-6276},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Manic Ivica Dj,Davidovic Vojkan S,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Stojadinovic Ninoslav D},
year={2008},
title={New approach in estimating the lifetime in NBT stressed p-channel power VDMOSFETs},
journal={2008 26TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS},
volume={},
number={},
pages={599-602},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Manic Ivica Dj,Djoric-Veljkovic Snezana M,Davidovic Vojkan S,Dankovic Danijel M,Golubovic Snezana M,Stojadinovic Ninoslav D},
year={2008},
title={Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs},
journal={IET CIRCUITS DEVICES & SYSTEMS},
volume={2},
number={2},
pages={213-221},
document_type={Article},
} 

@ARTICLE{
author={Stojadinovic Ninoslav D,Dankovic Danijel M,Manic Ivica Dj,Davidovic Vojkan S,Djoric-Veljkovic Snezana M,Golubovic Snezana M},
year={2007},
title={Impact of negative bias temperature instabilities on lifetime in p-channel power VDMOSFETs},
journal={TELSIKS 2007: 8TH INTERNATIONAL CONFERENCE ON TELECOMMUNICATIONS IN MODERN SATELLITE, CABLE AND BROADCASTING SERVICES, VOLS 1 AND 2},
volume={},
number={},
pages={275-282},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Dankovic Danijel M,Manic Ivica Dj,Davidovic Vojkan S,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Stojadinovic Ninoslav D},
year={2007},
title={Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs},
journal={MICROELECTRONICS RELIABILITY},
volume={47},
number={9-11},
pages={1400-1405},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Manic Ivica Dj,Djoric-Veljkovic Snezana M,Davidovic Vojkan S,Golubovic Snezana M,Stojadinovic Ninoslav D},
year={2006},
title={NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs},
journal={MICROELECTRONICS RELIABILITY},
volume={46},
number={9-11},
pages={1828-1833},
document_type={Article},
} 

@ARTICLE{
author={Stojadinovic Ninoslav D,Manic Ivica Dj,Davidovic Vojkan S,Dankovic Danijel M,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Dimitrijev Sima},
year={2006},
title={Electrical stressing effects in commercial power VDMOSFETs},
journal={IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS},
volume={153},
number={3},
pages={281-288},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Manic Ivica Dj,Djoric-Veljkovic Snezana M,Davidovic Vojkan S,Golubovic Snezana M,Stojadinovic Ninoslav D},
year={2006},
title={Lifetime estimation in NBT stressed P-channel power VDMOSFETs},
journal={2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings},
volume={},
number={},
pages={645-648},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Manic Ivica Dj,Djoric-Veljkovic Snezana M,Davidovic Vojkan S,Dankovic Danijel M,Golubovic Snezana M,Stojadinovic Ninoslav D},
year={2006},
title={Spontaneous recovery in DC gate bias stressed power VDMOSFETs},
journal={2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings},
volume={},
number={},
pages={639-644},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Stojadinovic Ninoslav D,Dankovic Danijel M,Djoric-Veljkovic Snezana M,Davidovic Vojkan S,Manic Ivica Dj,Golubovic Snezana M},
year={2005},
title={Negative bias temperature instability mechanisms in p-channel power VDMOSFETs},
journal={MICROELECTRONICS RELIABILITY},
volume={45},
number={9-11},
pages={1343-1348},
document_type={Article},
} 

@ARTICLE{
author={Stojadinovic Ninoslav D,Manic Ivica Dj,Davidovic Vojkan S,Dankovic Danijel M,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Dimitrijev Sima},
year={2005},
title={Effects of electrical stressing in power VDMOSFETS},
journal={MICROELECTRONICS RELIABILITY},
volume={45},
number={1},
pages={115-122},
document_type={Article},
} 

@ARTICLE{
author={Kalagasidis-Krusic Melina T,Dankovic Danijel M,Nikolic M,Filipovic Jovanka M},
year={2004},
title={Poly(acrylamide-co-itaconic acid) and semi-IPNS with poly(ethylene glycol): Preparation and characterization},
journal={MACROMOLECULAR CHEMISTRY AND PHYSICS},
volume={205},
number={16},
pages={2214-2220},
document_type={Article},
} 

@ARTICLE{
author={Stojadinovic Ninoslav D,Manic Ivica Dj,Davidovic Vojkan S,Dankovic Danijel M,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Dimitrijev Sima},
year={2003},
title={Effects of electrical stressing in power VDMOSFETs},
journal={2003 IEEE CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS},
volume={},
number={},
pages={291-296},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Stojadinovic Ninoslav D,Manic Ivica Dj,Djoric-Veljkovic Snezana M,Davidovic Vojkan S,Dankovic Danijel M,Golubovic Snezana M,Dimitrijev Sima},
year={2002},
title={Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs},
journal={MICROELECTRONICS RELIABILITY},
volume={42},
number={9-11},
pages={1465-1468},
document_type={Article},
} 

@ARTICLE{
author={Stojadinovic Ninoslav D,Manic Ivica Dj,Djoric-Veljkovic Snezana M,Davidovic Vojkan S,Dankovic Danijel M,Golubovic Snezana M,Dimitrijev Sima},
year={2002},
title={Spontaneous recovery of positive gate bias stressed power VDMOSFETs},
journal={2002 23RD INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS},
volume={},
number={},
pages={717-721},
document_type={Proceedings Paper},
}